 |
| |
 |
RAM-10000
& RAM-5000 SNAP (Ritec Inc., U.S.A) |
 |
RI-1000
/ 2000 / Ru Spec (Quasar, U.S.A) |
 |
EMF-500,
AIR-500 (Lasson Technologies, U.S.A) |
 |
IRIS-9000
(IRIS Inspection Services Inc., U.S.A) |
 |
Isonic-2001
(Sonotron NDT, Isreal) |
 |
MX/PX/MMX
Series, Thor, MAX (Dakota Ultrasonics, U.S.A) |
 |
PR-35,
PRC-35, PR-002A, DPR-500 (JSR Ultrasonics, U.S.A) |
 |
XU-2240,
XU-2468 (Xactex Corp., U.S.A) |
 |
ECHOGRAPH
1016 (Karldeutch,
German) |
 |
DFX-244
(Dakota Ultrasonics, U.S.A), DI-60
(INCO, Poland) |
 |
HA701
& HA-501 (Honda Electronics, Japan) |
 |
UMT-12
(INCO, Poland) |
 |
1050UP
(Accu-Tron Inc., U.S.A) |
 |
STR*8100,
STR-81G (Sonix, U.S.A) |
 |
TM-4P
(QMSystems, U.S.A) |
 |
Scorpion
(Silverwing Ltd., U.K) |
 |
Flawed
Specimen Kit (Flaw
Tech, U.S.A) |
 |
CF-0502
and others (Technisonic Research
Inc., U.S.A) |
 |
VSP-20
and others (Ultran
Laboratories, U.S.A) |
 |
Noise
Suppressor II (slx, U.S.A) |
 |
SPOT
(Willacy Oil Services Ltd., U.K) |
 |
USPC3100
/ ST-3000 (Socomate, France) |
 |
ABWIS
(Weld Inspection Systems, U.S.A) |
 |
EMAT
(EMAT Ultrasonics, U.S.A) |
 |
Automatic
UT System (MKC Korea,
Korea) |
 |
UDM-1100
(Teitsu Denshi Kenkyusho Co. Ltd., Japan) |
 |
FT-3000
(Aims ndt bv, Netherlands) |
 |
Ultraman-300
(MKC Korea, Korea) |
 |
IIW
Type 1 & others
(Applied Test Systems Inc., U.S.A) |
 |
MTX-8
(MKC NDT, Korea) |
 |
MK
Series (MKC NDT, Korea) |
 |
Modsonic
(India) |
 |
MK-510
(MKC NDT, Korea) |
 |
MKPA-5150
(mkcndt, Korea) |
| |
|
| |
|
| |
|
| |
|
| |
 |
| |
 |
MsSR-2020
(SwRI, U.S.A) |
| |
|
| |
 |
| |
 |
AMSY-5
(Vallen GmbH, Germany) |
| |
|
| |
 |
| |
 |
Elotest
Series (Rohmann, Germany) |
| |
|
| |
 |
| |
 |
Benchtop
(Pantak, U.S.A) |
 |
HF
Series (Pantak, U.S.A) |
 |
43855C
(Faxitron, U.S.A) |
 |
MFC-1000
& others (V.J. Technologies,
U.S.A) |
 |
Mini
MagSteer (Digital Radioscopy, U.S.A) |
 |
Ultrabright
(Oxford XTG, U.S.A) |
 |
Intra
Spec (Xitec, U.S.A) |
 |
Innov-X
(Innov-X Systems, U.S.A) |
| |
|
| |
 |
| |
 |
MK-500
(Kawatetsu Advantech Ltd., Japan) |
 |
MK-210
(Kawatetsu Advantech Ltd., Japan) |
 |
MK-10L
(Kawatetsu Advantech Ltd., Japan) |
 |
MK-60
(Kawatetsu Advantech Ltd., Japan) |
 |
CMS-3000
(Kawatetsu Advantech Ltd., Japan) |
| |
|
| |
 |
| |
 |
Surfix
Series (Phynix,
Germany) |
 |
Touchstone
3 (Class Instrument Ltd., U.K) |
 |
MD-20
& MD-120 (Meraster, Poland) |
 |
Feritscope
MP-30 (Fischer, U.S.A) |
 |
SH-75
(Kawatetsu Advantech Ltd., Japan) |
 |
B-Series
(Parker Research Corporation,
U.S.A) |
 |
BIB-150P
(Spectronics Corp.,
U.S.A) |
 |
MP-Series
(Fischer, U.S.A) |
 |
FLOORMAP
2000
(Silverwing Ltd., U.K) |
 |
A2002S
(Inco-Veritas, Poland) |
 |
Sigmascope
SMP-10 (Fischer,
U.S.A) |
 |
MK-A1
(M.K.C Korea, Korea) |
| |
|
| |
 |
| |
 |
Contester-1000
(Q-see man inter'l, Korea) |
 |
Half-Cell
2000 (Q-see man inter'l, Korea) |
 |
Covermeter-3000
(Q-see man inter'l, Korea) |
 |
Resitest-4000
(Q-see man inter'l, Korea) |
 |
FCT-101
(PGI International, U.K) |
 |
3LP
(RLC Instrument. Co., U.S.A) |
|
CTG-1
(OLSON Instruments Inc., U.S.A) |
|
Consonic-5000 |
| |
|
| |
